J. Segura

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2002

1 EE C. Hawkins, J. Segura: Testing Highly Integrated Wireless Circuits and Systems with Low Cost Tester: How to Overcome the Challenge? ITC 2002: 1228

2002
1	EE	C. Hawkins, J. Segura: Testing Highly Integrated Wireless Circuits and Systems with Low Cost Tester: How to Overcome the Challenge? ITC 2002: 1228

Coauthor Index

1 C. Hawkins [1]