Marvin S. Schwartz
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1975
1
William C. Lynch
,
John W. Langner
, Marvin S. Schwartz: Reliability Experience with Chi/OS.
IEEE Trans. Software Eng. 1
(2): 253-257 (1975)
Coauthor
Index
1
John W. Langner
[
1
]
2
William C. Lynch
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
