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| 2001 | ||
|---|---|---|
| 1 | EE | Constance E. Schuster, Mark G. Vangel, Harry A. Schafft: Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions. Microelectronics Reliability 41(2): 239-252 (2001) |
| 1 | Harry A. Schafft | [1] |
| 2 | Mark G. Vangel | [1] |