U. Schaper

2003
1	EE	Th. Nirschl, M. Ostermayr, A. Olbrich, D. Vietzke, M. Omer, C. Linnenbank, U. Schaper, Y. Pottgiesser, J. Pottgiesser, M. Johansson: MALTY--A memory test structure for analysis in the early phase of the technology development. Microelectronics Reliability 43(9-11): 1383-1387 (2003)

Coauthor Index

1	M. Johansson	[1]
2	C. Linnenbank	[1]
3	Th. Nirschl	[1]
4	A. Olbrich	[1]
5	M. Omer	[1]
6	M. Ostermayr	[1]
7	J. Pottgiesser	[1]
8	Y. Pottgiesser	[1]
9	D. Vietzke	[1]