A. Schütz
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1982
1
EE
A. Schütz,
Siegfried Selberherr
,
Hans W. Pötzl
: Analysis of Breakdown Phenomena in MOSFET's.
IEEE Trans. on CAD of Integrated Circuits and Systems 1
(2): 77-85 (1982)
Coauthor
Index
1
Hans W. Pötzl
[
1
]
2
Siegfried Selberherr
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
