M. Sanada

List of publications from the DBLP Bibliography Server - FAQ

2006

1 EE M. Sanada, Y. Yoshizawa: Fault diagnosis technology based on transistor behavior analysis for physical analysis. Microelectronics Reliability 46(9-11): 1575-1580 (2006)

2006
1	EE	M. Sanada, Y. Yoshizawa: Fault diagnosis technology based on transistor behavior analysis for physical analysis. Microelectronics Reliability 46(9-11): 1575-1580 (2006)

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