M. Sachdev

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2002

2 EE Wai Chung, T. Lo, M. Sachdev: A comparative analysis of low-power low-voltage dual-edge-triggered flip-flops. IEEE Trans. VLSI Syst. 10(6): 913-918 (2002)

1997

1 EE M. Sachdev: Deep sub-micron I_DDQ testing: issues and solutions. ED&TC 1997: 271-278

2002
2	EE	Wai Chung, T. Lo, M. Sachdev: A comparative analysis of low-power low-voltage dual-edge-triggered flip-flops. IEEE Trans. VLSI Syst. 10(6): 913-918 (2002)
1997
1	EE	M. Sachdev: Deep sub-micron I_DDQ testing: issues and solutions. ED&TC 1997: 271-278

Coauthor Index

1 Wai Chung [2]

2 T. Lo [2]