John J. SIDorowich
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1997
1
Mark Land
, John J. SIDorowich,
Richard K. Belew
: Using Genetic Algorithms with Local Search for Thin Film Metrology.
ICGA 1997
: 537-544
Coauthor
Index
1
Richard K. Belew
[
1
]
2
Mark Land
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
