| |
| 2001 | ||
|---|---|---|
| 1 | EE | Joachim Würfl, Paul Kurpas, Frank Brunner, Michael Mai, Matthias Rudolph, Markus Weyers: Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing. Microelectronics Reliability 41(8): 1103-1108 (2001) |
| 1 | Frank Brunner | [1] |
| 2 | Paul Kurpas | [1] |
| 3 | Michael Mai | [1] |
| 4 | Markus Weyers | [1] |
| 5 | Joachim Würfl | [1] |