A. J. van Roosmalen
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2006
1
EE
A. J. van Roosmalen,
G. Q. Zhang
: Reliability challenges in the nanoelectronics era.
Microelectronics Reliability 46
(9-11): 1403-1414 (2006)
Coauthor
Index
1
G. Q. Zhang
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
