2007 |
14 | EE | Diljith M. Thodi,
Jeffrey J. Rodríguez:
Expansion Embedding Techniques for Reversible Watermarking.
IEEE Transactions on Image Processing 16(3): 721-730 (2007) |
2004 |
13 | | Diljith M. Thodi,
Jeffrey J. Rodríguez:
Prediction-error based reversible watermarking.
ICIP 2004: 1549-1552 |
2002 |
12 | EE | Mary L. Cassabaum,
Jeffrey J. Rodríguez,
Jack G. Riddle,
Donald E. Waagen:
Feature Analysis Using Millimeter-Wave Real Beam and Doppler Beam Sharpening Techniques.
SSIAI 2002: 101-105 |
2000 |
11 | | Te-shen Liang,
Jeffrey J. Rodríguez:
A Modified Robust Embedding Scheme for Faithful Watermark Extraction.
ICIP 2000 |
10 | | Bruce A. Thomas,
Jeffrey J. Rodríguez:
Wavelet-Based Color Image Denoising.
ICIP 2000 |
9 | EE | Phillip A. Mlsna,
Jeffrey J. Rodríguez:
Efficient Indexing of Multi-Color Sets for Content-Based Image Retrieval.
SSIAI 2000: 116-120 |
8 | EE | Te-shen Liang,
Jeffrey J. Rodríguez:
Robust Image Watermarking Using Inversely Proportional Embedding.
SSIAI 2000: 182-186 |
1997 |
7 | EE | Bruce A. Thomas,
Robin N. Strickland,
Jeffrey J. Rodríguez:
Color Image Enhancement Using Spatially Adaptive Saturation Feedback.
ICIP (3) 1997: 30 |
1995 |
6 | | Jeffrey J. Rodríguez,
Christopher C. Yang:
High-Resolution Histogram Modification of Color Images.
CVGIP: Graphical Model and Image Processing 57(5): 432-440 (1995) |
1994 |
5 | | James L. Lee,
Jeffrey J. Rodríguez:
Edge-Based Segmentation of 3-D Magnetic Resonance Images.
ICIP (1) 1994: 876-880 |
4 | | Phillip A. Mlsna,
Jeffrey J. Rodríguez:
Explosion of Multidimensional Image Histograms.
ICIP (3) 1994: 958-962 |
3 | EE | Jeffrey J. Rodríguez,
Christopher C. Yang:
Effects of luminance quantization error on color image processing.
IEEE Transactions on Image Processing 3(6): 850-854 (1994) |
1990 |
2 | EE | Jeffrey J. Rodríguez,
J. K. Aggarwal:
Matching Aerial Images to 3-D Terrain Maps.
IEEE Trans. Pattern Anal. Mach. Intell. 12(12): 1138-1149 (1990) |
1 | EE | Jeffrey J. Rodríguez,
J. K. Aggarwal:
Stochastic Analysis of Stereo Quantization Error.
IEEE Trans. Pattern Anal. Mach. Intell. 12(5): 467-470 (1990) |