| |
| 2003 | ||
|---|---|---|
| 1 | EE | I. Boyer Heard, R. Coquillé, D. Rivière, P.-Y. Klimonda: Characterization and reliability of a switch matrix based on MOEMS technology. Microelectronics Reliability 43(9-11): 1935-1937 (2003) |
| 1 | R. Coquillé | [1] |
| 2 | I. Boyer Heard | [1] |
| 3 | P.-Y. Klimonda | [1] |