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| 2003 | ||
|---|---|---|
| 1 | EE | E. R. Davies, Michael Bateman, D. R. Mason, J. Chambers, C. Ridgway: Design of efficient line segment detectors for cereal grain inspection. Pattern Recognition Letters 24(1-3): 413-428 (2003) |
| 1 | Michael Bateman | [1] |
| 2 | J. Chambers | [1] |
| 3 | Edward Roy Davies (E. R. Davies) | [1] |
| 4 | D. R. Mason | [1] |