Mark Rich

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2007

2 EE Thomas Hammel, Mark Rich: A higher capability sensor node platform suitable for demanding applications. IPSN 2007: 138-147

1986

1 Mark Rich: A Method of Flexible Catch RAM Display for Memory Testing. ITC 1986: 222

2007
2	EE	Thomas Hammel, Mark Rich: A higher capability sensor node platform suitable for demanding applications. IPSN 2007: 138-147
1986
1		Mark Rich: A Method of Flexible Catch RAM Display for Memory Testing. ITC 1986: 222

Coauthor Index

1 Thomas Hammel [2]