Mark Rich
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2007
2
EE
Thomas Hammel
, Mark Rich: A higher capability sensor node platform suitable for demanding applications.
IPSN 2007
: 138-147
1986
1
Mark Rich: A Method of Flexible Catch RAM Display for Memory Testing.
ITC 1986
: 222
Coauthor
Index
1
Thomas Hammel
[
2
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)