A. D. van Rheenen

2001
1	EE	X. Y. Chen, A. Pedersen, A. D. van Rheenen: Effect of electrical and thermal stress on low-frequency noise characteristics of laser diodes. Microelectronics Reliability 41(1): 105-110 (2001)

Coauthor Index

1	X. Y. Chen	[1]
2	A. Pedersen	[1]