| |
| 1998 | ||
|---|---|---|
| 2 | Lama Nachman, Kewal K. Saluja, Shambhu J. Upadhyaya, Robert Reuse: A Novel Approach to Random Pattern Testing of Sequential Circuits. IEEE Trans. Computers 47(1): 129-134 (1998) | |
| 1996 | ||
| 1 | Lama Nachman, Kewal K. Saluja, Shambhu J. Upadhyaya, Robert Reuse: Random Pattern Testing for Sequential Circuits Revisited. FTCS 1996: 44-52 | |
| 1 | Lama Nachman | [1] [2] |
| 2 | Kewal K. Saluja | [1] [2] |
| 3 | Shambhu J. Upadhyaya | [1] [2] |