Juan C. Ranuárez
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2006
1
EE
Juan C. Ranuárez,
M. Jamal Deen
,
Chih-Hung Chen
: A review of gate tunneling current in MOS devices.
Microelectronics Reliability 46
(12): 1939-1956 (2006)
Coauthor
Index
1
Chih-Hung Chen
[
1
]
2
M. Jamal Deen
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
