J. Raja

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2006

2 EE B. Krishna Kumar, J. Raja: On multiserver feedback retrial queues with balking and control retrial rate. Annals OR 141(1): 211-232 (2006)

2002

1 EE B. Muralikrishnan, K. Najarian, J. Raja: Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application. ICPR (1) 2002: 29-32

2006
2	EE	B. Krishna Kumar, J. Raja: On multiserver feedback retrial queues with balking and control retrial rate. Annals OR 141(1): 211-232 (2006)
2002
1	EE	B. Muralikrishnan, K. Najarian, J. Raja: Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application. ICPR (1) 2002: 29-32

Coauthor Index

1 B. Krishna Kumar [2]

2 B. Muralikrishnan [1]

3 K. Najarian [1]

Colors in the list of coauthors