B. Muralikrishnan
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2002
1
EE
B. Muralikrishnan,
K. Najarian
,
J. Raja
: Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application.
ICPR (1) 2002
: 29-32
Coauthor
Index
1
K. Najarian
[
1
]
2
J. Raja
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)