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J. Raczkowycz

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1996
1EEJ. Raczkowycz, S. Allott, T. I. Pritchard: A data optimization test technique for characterizing embedded ADCs. J. Electronic Testing 9(1-2): 165-175 (1996)

Coauthor Index

1S. Allott [1]
2T. I. Pritchard [1]

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