J. Raczkowycz
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1996
1
EE
J. Raczkowycz,
S. Allott
,
T. I. Pritchard
: A data optimization test technique for characterizing embedded ADCs.
J. Electronic Testing 9
(1-2): 165-175 (1996)
Coauthor
Index
1
S. Allott
[
1
]
2
T. I. Pritchard
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
