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| 2002 | ||
|---|---|---|
| 1 | EE | Klaus Duerr, Reinhard Pusch, Gottfried Schmitt: Reliability Problems of Passive Optical Devices and Modules after Mechanical, Thermal and Humidity Testing. Microelectronics Reliability 42(9-11): 1329-1332 (2002) |
| 1 | Klaus Duerr | [1] |
| 2 | Gottfried Schmitt | [1] |