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Scott Pozder

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2009
1EESyed M. Alam, Robert E. Jones, Scott Pozder, Ankur Jain: Die/wafer stacking with reciprocal design symmetry (RDS) for mask reuse in three-dimensional (3D) integration technology. ISQED 2009: 569-575

Coauthor Index

1Syed M. Alam [1]
2Ankur Jain [1]
3Robert E. Jones [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)