R. S. Popovic
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2001
1
EE
D. Manic
,
J. Petr
, R. S. Popovic: Die stress drift measurement in IC plastic packages using the piezo-Hall effect.
Microelectronics Reliability 41
(5): 767-771 (2001)
Coauthor
Index
1
D. Manic
[
1
]
2
J. Petr
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
