T. Poiroux
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2001
1
EE
G. Reimbold
, T. Poiroux: Plasma charging damage mechanisms and impact on new technologies.
Microelectronics Reliability 41
(7): 959-965 (2001)
Coauthor
Index
1
G. Reimbold
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
