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| 2001 | ||
|---|---|---|
| 1 | EE | O. Mrooz, A. Kovalski, J. Pogorzelska, O. Shpotyuk, M. Vakiv, Bohdan S. Butkiewicz, J. Maciak: Thermoelectrical degradation processes in NTC thermistors for in-rush current protection of electronic circuits. Microelectronics Reliability 41(5): 773-777 (2001) |
| 1 | Bohdan S. Butkiewicz | [1] |
| 2 | A. Kovalski | [1] |
| 3 | J. Maciak | [1] |
| 4 | O. Mrooz | [1] |
| 5 | O. Shpotyuk | [1] |
| 6 | M. Vakiv | [1] |