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J. Podlecki

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2007
4EES. Youssef, R. Al Asmar, J. Podlecki, F. Pascal-Delannoy, Y. Zaatar, A. Foucaran: Characterization of LiTaO3 thin films fabricated by sol-gel technique. Microelectronics Journal 38(1): 63-66 (2007)
3EEY. Zaatar, R. Al Asmar, J. Podlecki, S. Youssef, M. Abdallah, N. Ouaini, A. Foucaran: Fabrication and characterization of stacked ZnO and ZnOGa2O3 layers for the realization of bulk acoustic wave resonated membranes. Microelectronics Journal 38(4-5): 538-546 (2007)
2EED. Zaouk, R. Al Asmar, J. Podlecki, Y. Zaatar, A. Khoury, A. Foucaran: X-ray diffraction studies of electrostatic sprayed SnO2: F films. Microelectronics Journal 38(8-9): 884-887 (2007)
2006
1EER. Al Asmar, J.-P. Atanas, Y. Zaatar, J. Podlecki, A. Foucaran: Characterization and ellipsometric investigation of high-quality ZnO and ZnO(Ga2O3) thin alloys by reactive electron-beam co-evaporation technique. Microelectronics Journal 37(10): 1080-1085 (2006)

Coauthor Index

1M. Abdallah [3]
2R. Al Asmar [1] [2] [3] [4]
3J.-P. Atanas [1]
4A. Foucaran [1] [2] [3] [4]
5A. Khoury [2]
6N. Ouaini [3]
7F. Pascal-Delannoy [4]
8S. Youssef [3] [4]
9Y. Zaatar [1] [2] [3] [4]
10D. Zaouk [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)