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| 2006 | ||
|---|---|---|
| 1 | EE | R. Al Asmar, J.-P. Atanas, Y. Zaatar, J. Podlecki, A. Foucaran: Characterization and ellipsometric investigation of high-quality ZnO and ZnO(Ga2O3) thin alloys by reactive electron-beam co-evaporation technique. Microelectronics Journal 37(10): 1080-1085 (2006) |
| 1 | R. Al Asmar | [1] |
| 2 | A. Foucaran | [1] |
| 3 | J. Podlecki | [1] |
| 4 | Y. Zaatar | [1] |