R. Plieninger
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2006
1
EE
R. Plieninger,
M. Dittes
,
K. Pressel
: Modern IC packaging trends and their reliability implications.
Microelectronics Reliability 46
(9-11): 1868-1873 (2006)
Coauthor
Index
1
M. Dittes
[
1
]
2
K. Pressel
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
