| |
| 2007 | ||
|---|---|---|
| 1 | EE | E. Phelps, Peter Willett, Thia Kirubarajan, Craig Brideau: Predicting Time to Failure Using the IMM and Excitable Tests. IEEE Transactions on Systems, Man, and Cybernetics, Part A 37(5): 630-642 (2007) |
| 1 | Craig Brideau | [1] |
| 2 | Thia Kirubarajan (Thiagalingam Kirubarajan) | [1] |
| 3 | Peter Willett (Peter K. Willett) | [1] |