Sylvie Perreault
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1989
1
Norman Nadeau
, Sylvie Perreault: An Analysis of Tungsten Probes' Effect on Yield in a Production Wafer Probe Environment.
ITC 1989
: 208-215
Coauthor
Index
1
Norman Nadeau
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
