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| 2002 | ||
|---|---|---|
| 2 | EE | Jonathan L. Paulsen, Erik K. Reed: Highly accelerated lifetesting of base-metal-electrode ceramic chip capacitors. Microelectronics Reliability 42(6): 815-820 (2002) |
| 1 | EE | Erik K. Reed, Jonathan L. Paulsen: Impact of circuit resistance on the breakdown voltage of tantalum chip capacitors. Microelectronics Reliability 42(6): 821-827 (2002) |
| 1 | Erik K. Reed | [1] [2] |