Jagdish Patel
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2004
1
EE
Tanay Karnik
,
Peter Hazucha
, Jagdish Patel: Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes.
IEEE Trans. Dependable Sec. Comput. 1
(2): 128-143 (2004)
Coauthor
Index
1
Peter Hazucha
[
1
]
2
Tanay Karnik
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)