Leah Pastel
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2004
1
EE
Leendert M. Huisman
,
Maroun Kassab
, Leah Pastel: Data Mining Integrated Circuit Fails with Fail Commonalities.
ITC 2004
: 661-668
Coauthor
Index
1
Leendert M. Huisman
[
1
]
2
Maroun Kassab
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
