2009 |
13 | EE | David W. Paglieroni,
Walter G. Eppler:
Resolution analysis for Gradient Direction Matching of object model edges to overhead images.
Computer Vision and Image Understanding 113(2): 235-248 (2009) |
2008 |
12 | EE | Siddharth Manay,
David W. Paglieroni:
Detecting polygons of variable dimension in overhead images with particle filters.
ICIP 2008: 2372-2375 |
2007 |
11 | EE | David W. Paglieroni,
Faranak Nekoogar:
Matching Random Tree Models of Spatio-Temporal Patterns to Tables or Graphs.
CIDM 2007: 560-567 |
10 | EE | Siddharth Manay,
David W. Paglieroni:
Matching Flexible Polygons to Fields of Corners Extracted from Images.
ICIAR 2007: 447-459 |
2004 |
9 | EE | David W. Paglieroni:
Design considerations for image segmentation quality assessment measures.
Pattern Recognition 37(8): 1607-1617 (2004) |
1999 |
8 | | David W. Paglieroni:
A Complexity Analysis for Directional Parametric Height Field Ray Tracing.
Graphical Models and Image Processing 61(5): 299-321 (1999) |
1998 |
7 | EE | David W. Paglieroni:
The Directional Parameter Plane Transform of a Height Field.
ACM Trans. Graph. 17(1): 50-70 (1998) |
1997 |
6 | | David W. Paglieroni:
Directional Distance Transforms and Height Field Preprocessing for Efficient Ray Tracing.
CVGIP: Graphical Model and Image Processing 59(4): 253-264 (1997) |
1994 |
5 | EE | David W. Paglieroni,
Sidney M. Petersen:
Height distributional distance transform methods for height field ray tracing.
ACM Trans. Graph. 13(4): 376-399 (1994) |
4 | EE | David W. Paglieroni,
Gary E. Ford,
Eric M. Tsujimoto:
The Position-Orientation Masking Approach to Parametric Search for Template Matching.
IEEE Trans. Pattern Anal. Mach. Intell. 16(7): 740-747 (1994) |
1992 |
3 | EE | David W. Paglieroni:
Distance transforms: Properties and machine vision applications.
CVGIP: Graphical Model and Image Processing 54(1): 56-74 (1992) |
1988 |
2 | EE | David W. Paglieroni,
Anil K. Jain:
Control point transforms for shape representation and measurement.
Computer Vision, Graphics, and Image Processing 42(1): 87-111 (1988) |
1987 |
1 | EE | David W. Paglieroni,
Anil K. Jain:
Fast classification of discrete shape contours.
Pattern Recognition 20(6): 583-598 (1987) |