Edgar Olthof
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2006
1
EE
Jingchao Wang
, Edgar Olthof,
Wim Metselaar
: Hot-carrier degradation analysis based on ring oscillators.
Microelectronics Reliability 46
(9-11): 1858-1863 (2006)
Coauthor
Index
1
Wim Metselaar
[
1
]
2
Jingchao Wang
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
