Patrick L. Odell

1984
8	EE	Dean M. Young, Patrick L. Odell: A formulation and comparison of two linear feature selection techniques applicable to statistical classification. Pattern Recognition 17(3): 331-337 (1984)
1981
7	EE	Henry P. Decell Jr., Patrick L. Odell, William A. Coberly: Linear dimension reduction and Bayes classification. Pattern Recognition 13(3): 241-243 (1981)
1979
6	EE	Patrick L. Odell: A model for dimension reduction in pattern recognition using continuous data. Pattern Recognition 11(1): 51-54 (1979)
1975
5	EE	Thomas Loris Boullion, Patrick L. Odell, B. S. Duran: Estimating the probability of misclassification and variate selection. Pattern Recognition 7(3): 139-145 (1975)
1974
4	EE	J. P. Basu, Patrick L. Odell: Effect of intraclass correlation among training samples on the misclassification probabilities of bayes procedure. Pattern Recognition 6(1): 13-16 (1974)
1973
3	EE	Raj S. Chhikara, Patrick L. Odell: Discriminant analysis using certain normed exponential densities with emphasis on remote sensing application. Pattern Recognition 5(3): 259-272 (1973)
1968
2	EE	Gerald L. Morris, Patrick L. Odell: Common Solutions for n Matrix Equations With Applications. J. ACM 15(2): 272-274 (1968)
1967
1	EE	Patrick L. Odell, E. P. Decell: On Computing the Fixed-Point Probability Vector of Ergodic Transition Matrices. J. ACM 14(4): 765-768 (1967)

Coauthor Index

1	J. P. Basu	[4]
2	Thomas Loris Boullion	[5]
3	Raj S. Chhikara	[3]
4	William A. Coberly	[7]
5	E. P. Decell	[1]
6	Henry P. Decell Jr.	[7]
7	B. S. Duran	[5]
8	Gerald L. Morris	[2]
9	Dean M. Young	[8]

Colors in the list of coauthors