Raj S. Chhikara

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1973

1 EE Raj S. Chhikara, Patrick L. Odell: Discriminant analysis using certain normed exponential densities with emphasis on remote sensing application. Pattern Recognition 5(3): 259-272 (1973)

1973
1	EE	Raj S. Chhikara, Patrick L. Odell: Discriminant analysis using certain normed exponential densities with emphasis on remote sensing application. Pattern Recognition 5(3): 259-272 (1973)

Coauthor Index

1 Patrick L. Odell [1]