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| 2009 | ||
|---|---|---|
| 1 | EE | Brendan Mullane, Ciaran MacNamee, Vincent O'Brien, Thomas Fleischmann: An on-chip solution for static ADC test and measurement. ACM Great Lakes Symposium on VLSI 2009: 81-86 |
| 1 | Thomas Fleischmann | [1] |
| 2 | Ciaran MacNamee | [1] |
| 3 | Brendan Mullane | [1] |