H. Keith Nishihara

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1988

2 EE H. Keith Nishihara, P. A. Crossley: Measuring Photolithographic Overlay Accuracy and Critical Dimensions by Correlating Binarized Laplacian of Gaussian Convolutions. IEEE Trans. Pattern Anal. Mach. Intell. 10(1): 17-30 (1988)

1981

1 H. Keith Nishihara: Intensity, Visible-Surface, and Volumetric Representations. Artif. Intell. 17(1-3): 265-284 (1981)

1988
2	EE	H. Keith Nishihara, P. A. Crossley: Measuring Photolithographic Overlay Accuracy and Critical Dimensions by Correlating Binarized Laplacian of Gaussian Convolutions. IEEE Trans. Pattern Anal. Mach. Intell. 10(1): 17-30 (1988)
1981
1		H. Keith Nishihara: Intensity, Visible-Surface, and Volumetric Representations. Artif. Intell. 17(1-3): 265-284 (1981)

Coauthor Index

1 P. A. Crossley [2]