| |
| 2001 | ||
|---|---|---|
| 1 | EE | Zhenqiu Ning, Yuri Sneyders, Wim Vanderbauwhede, Renaud Gillon, Marnix Tack, Paul Raes: A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies. Microelectronics Reliability 41(12): 1939-1945 (2001) |
| 1 | Renaud Gillon | [1] |
| 2 | Paul Raes | [1] |
| 3 | Yuri Sneyders | [1] |
| 4 | Marnix Tack | [1] |
| 5 | Wim Vanderbauwhede | [1] |