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Ivan N. Ndip

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2005
1EEIvan N. Ndip, Grit Sommer, Werner John, Herbert Reichl: Characterization of bump arrays at RF/microwave frequencies. Microelectronics Reliability 45(3-4): 551-558 (2005)

Coauthor Index

1Werner John [1]
2Herbert Reichl [1]
3Grit Sommer [1]

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