Ivan N. Ndip
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2005
1
EE
Ivan N. Ndip,
Grit Sommer
,
Werner John
,
Herbert Reichl
: Characterization of bump arrays at RF/microwave frequencies.
Microelectronics Reliability 45
(3-4): 551-558 (2005)
Coauthor
Index
1
Werner John
[
1
]
2
Herbert Reichl
[
1
]
3
Grit Sommer
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)