Masahisa Nakazawa
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1990
1
EE
Masahisa Nakazawa,
Susumu Nitta
,
Kanji Hirabayashi
: Probabilistic fault grading based on activation checking and observability analysis.
J. Electronic Testing 1
(3): 235-238 (1990)
Coauthor
Index
1
Kanji Hirabayashi
[
1
]
2
Susumu Nitta
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
