| |
| 1999 | ||
|---|---|---|
| 1 | EE | Shunji Maeda, Makoto Ono, Hitoshi Kubota, Mitsuo Nakatani: Precise detection of short-circuit defects on TFT substrate by infrared image matching. Systems and Computers in Japan 30(12): 72-84 (1999) |
| 1 | Hitoshi Kubota | [1] |
| 2 | Shunji Maeda | [1] |
| 3 | Makoto Ono | [1] |