| |
| 1999 | ||
|---|---|---|
| 2 | EE | Shunji Maeda, Makoto Ono, Hitoshi Kubota, Mitsuo Nakatani: Precise detection of short-circuit defects on TFT substrate by infrared image matching. Systems and Computers in Japan 30(12): 72-84 (1999) |
| 1998 | ||
| 1 | EE | Shunji Maeda, Fumiaki Endo, Hiroshi Makihira, Hitoshi Kubota: Threshold setting assisted by numerical analysis methods in automatic visual inspection using gray-scale image comparison. Systems and Computers in Japan 29(14): 81-91 (1998) |
| 1 | Fumiaki Endo | [1] |
| 2 | Shunji Maeda | [1] [2] |
| 3 | Hiroshi Makihira | [1] |
| 4 | Mitsuo Nakatani | [2] |
| 5 | Makoto Ono | [2] |