Christine Naito

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2002

1 EE Christine Naito, Michael Todd: The effects of curing parameters on the properties development of an epoxy encapsulant material. Microelectronics Reliability 42(1): 119-125 (2002)

2002
1	EE	Christine Naito, Michael Todd: The effects of curing parameters on the properties development of an epoxy encapsulant material. Microelectronics Reliability 42(1): 119-125 (2002)

Coauthor Index

1 Michael Todd [1]