| |
| 1993 | ||
|---|---|---|
| 2 | EE | Yasushi Koseko, Takuji Ogihara, Shinichi Murai: Tri-state bus conflict checking method for ATPG using BDD. ICCAD 1993: 512-515 |
| 1985 | ||
| 1 | EE | Takuji Ogihara, Shuichi Saruyama, Shinichi Murai: PATEGE: an automatic DC parametric test generation system for series gated ECL circuits. DAC 1985: 212-218 |
| 1 | Yasushi Koseko | [2] |
| 2 | Takuji Ogihara | [1] [2] |
| 3 | Shuichi Saruyama | [1] |