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| 2003 | ||
|---|---|---|
| 1 | EE | B. Morillon, Jean-Marie Dilhac, Christian Ganibal, C. Anceau: Study of aluminum thermomigration as a low thermal budget technique for innovative power devices. Microelectronics Reliability 43(4): 565-569 (2003) |
| 1 | C. Anceau | [1] |
| 2 | Jean-Marie Dilhac | [1] |
| 3 | Christian Ganibal | [1] |