| |
| 2006 | ||
|---|---|---|
| 1 | EE | Kazuhiro Mochizuki, Ken-ichi Tanaka, Takashi Shiota, Takafumi Taniguchi, Hiroyuki Uchiyama: Effects of Rapid Thermal Annealing on Bias-Stress-Induced Base Leakage in InGaP/GaAs Collector-Up Heterojunction Bipolar Transistors Fabricated with B Ion Implantation. IEICE Transactions 89-C(7): 943-948 (2006) |
| 1 | Takashi Shiota | [1] |
| 2 | Ken-ichi Tanaka | [1] |
| 3 | Takafumi Taniguchi | [1] |
| 4 | Hiroyuki Uchiyama | [1] |