2001 | ||
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1 | EE | W. T. Anderson, J. A. Roussos, J. A. Mittereder, D. E. Ioannou, C. Moglestue: Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study. Microelectronics Reliability 41(8): 1109-1113 (2001) |
1 | W. T. Anderson | [1] |
2 | D. E. Ioannou | [1] |
3 | C. Moglestue | [1] |
4 | J. A. Roussos | [1] |