| 2008 |
|---|
| 5 | EE | Yoan Miche,
Patrick Bas,
Christian Jutten,
Olli Simula,
Amaury Lendasse:
A Methodology for Building Regression Models using Extreme Learning Machine: OP-ELM.
ESANN 2008: 247-252 |
| 4 | EE | Yoan Miche,
Antti Sorjamaa,
Amaury Lendasse:
OP-ELM: Theory, Experiments and a Toolbox.
ICANN (1) 2008: 145-154 |
| 3 | EE | Antti Sorjamaa,
Yoan Miche,
Robert Weiss,
Amaury Lendasse:
Long-term prediction of time series using NNE-based projection and OP-ELM.
IJCNN 2008: 2674-2680 |
| 2007 |
|---|
| 2 | EE | Yoan Miche,
Patrick Bas,
Amaury Lendasse,
Christian Jutten,
Olli Simula:
Advantages of Using Feature Selection Techniques on Steganalysis Schemes.
IWANN 2007: 606-613 |
| 2006 |
|---|
| 1 | EE | Yoan Miche,
Benoit Roue,
Amaury Lendasse,
Patrick Bas:
A Feature Selection Methodology for Steganalysis.
MRCS 2006: 49-56 |
